By John V. Gilfrich (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Ting C. Huang, Paul K. Predecki (eds.)
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Additional resources for Advances in X-Ray Analysis: Volume 32
The required exposure time is extremely short, enabling sufficient data for structure determination to be accumulated in a few minutes (circumventing several of the problems encountered with monochromatic radiation in single counter mode). Single Laue exposures from macromolecular structures have been recorded in a few seconds at SRS, Daresbury  and, very recently, from photons emitted from a single 150 picosecond bunch in the storage ring at CHESS . Although exposing samples to the full white beam greatly increases the potential for radiation damage, and although Laue data present some difficulties to structure solution , the use of Laue diffraction using synchrotron X-rays clearly promises to be an powerful technique.
3~ I. 5~ 2 I. Fe-Koe Cr-Ko( tin-free steel. Fluorescent X-rays can be excited with low power X-ray tubes, high power X-ray tubes and a radioisotope, 241Am, which emits 60 keV y-rays. Optical systems use a nondispersive method and a wavelength dispersive method. The former uses a scintillation or proportional counter, or an ionization chamber with a specified filter. The latter uses crystal monochromators for complex sample measurement. The response times of the various instruments are also shown.
46. D. H. Templeton and L. K. Templeton, X-ray dichroism and anomalous scattering of potassium tetrachloroplatinate(II), Acta Cryst. A41 365-371 (1985). 47. H. K. Mao, A. P. Jephcoat, R. J. Hem1ey, L. W. Finger, C. S. Zha, R. M. Hazen and D. E. 5 gigapascals, Science 239 1131-1134 (1988). 48. H. E. King and J. M. 5GPa, in preparation (1988). 49. P. Eisenberger, J. M. Newsam, M. E. Leonowicz and D. E. W. Vaughan, Synchrotron X-ray diffraction from a 800llm3 zeolite microcrystal, Nature 309 45-47 (1984).
Advances in X-Ray Analysis: Volume 32 by John V. Gilfrich (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Ting C. Huang, Paul K. Predecki (eds.)